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ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /

Corporate Authors:	International Symposium for Testing and Failure Analysis Dallas, Tex.), ASM International., Electronic Device Failure Analysis Society.
Format:	Book
Language:	English
Published:	Materials Park, Ohio : ASM International, 2010.
Subjects:	Electronics > Materials > Testing Electronic apparatus and appliances > Testing
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10439476

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