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| LEADER |
01180nam a2200229 a 4500 |
| 001 |
1847850 |
| 005 |
20171111234631.0 |
| 008 |
110114s2010 ohua sb 101 0 eng d |
| 020 |
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|z 9781615030415
|z 0615030416
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| 040 |
|
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|a CaPaEBR
|z 9781615037278 (e-book)
|
| 050 |
1 |
4 |
|a TK7871
|b .I87 2010eb
|
| 111 |
2 |
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|a International Symposium for Testing and Failure Analysis
|c Dallas, Tex.)
|d 2010 :
|
| 245 |
1 |
0 |
|a ISTFA 2010
|b conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
|c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International.
|
| 260 |
|
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|a Materials Park, Ohio :
|b ASM International,
|c 2010.
|
| 300 |
|
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|a xix, 464 p. :
|b ill. (some col.)
|
| 504 |
|
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|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Electronics
|x Materials
|x Testing
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|
| 710 |
2 |
|
|a ASM International.
|
| 710 |
2 |
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|a Electronic Device Failure Analysis Society.
|
| 856 |
4 |
0 |
|a ebrary, Inc.
|u http://site.ebrary.com/lib/ucy/Doc?id=10439476
|
| 952 |
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|a CY-NiOUC
|b 5a045f5e6c5ad14ac1edf70d
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
|
