ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /

Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Materials Park, Ohio : Asm International, 2009.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10374914

Internet

http://site.ebrary.com/lib/ucy/Doc?id=10374914
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