ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Thirty-third International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, c2007.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10320340

Internet

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