Cover Image

Atomic force microscopy exploring basic modes and advanced applications /

Main Author:	Haugstad, Greg, 1963-
Corporate Author:	ebrary, Inc.
Format:	Book
Language:	English
Published:	Hoboken, N.J. : John Wiley & Sons, c2012.
Subjects:	Atomic force microscopy.
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10606048

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