Atomic force microscopy exploring basic modes and advanced applications /

Main Author: Haugstad, Greg, 1963-
Corporate Author: ebrary, Inc.
Format: Book
Language:English
Published: Hoboken, N.J. : John Wiley & Sons, c2012.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10606048
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300 |a xxii, 464 p. :  |b ill. 
504 |a Includes bibliographical references and index. 
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