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00761nam a2200205 a 4500 |
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1818617 |
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20171111234603.0 |
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120302s2012 njua sb 001 0 eng d |
020 |
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|z 9780470638828
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040 |
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|a CaPaEBR
|z 9781118360699 (ebook)
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050 |
1 |
4 |
|a QH212.A78
|b H38 2012eb
|
100 |
1 |
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|a Haugstad, Greg,
|d 1963-
|
245 |
1 |
0 |
|a Atomic force microscopy
|b exploring basic modes and advanced applications /
|c Greg Haugstad.
|
260 |
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|a Hoboken, N.J. :
|b John Wiley & Sons,
|c c2012.
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300 |
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|a xxii, 464 p. :
|b ill.
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504 |
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|a Includes bibliographical references and index.
|
650 |
|
0 |
|a Atomic force microscopy.
|
710 |
2 |
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|a ebrary, Inc.
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856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10606048
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952 |
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|a CY-NiOUC
|b 5a045bff6c5ad14ac1ed7e70
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
|