Scanning force microscopy with applications to electric, magnetic, and atomic forces /
| Main Author: | |
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| Corporate Author: | |
| Format: | Book |
| Language: | English |
| Published: |
New York :
Oxford University Press,
1994.
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| Edition: | Rev. ed. |
| Series: | Oxford series in optical and imaging sciences ;
5 |
| Subjects: | |
| Online Access: | http://site.ebrary.com/lib/ucy/Doc?id=10087124 |