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940126s1994 nyua sb 001 0 eng d |
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|a CaPaEBR
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|a QH212.S32
|b S27 1994eb
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| 100 |
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|a Sarid, Dror.
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| 245 |
1 |
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|a Scanning force microscopy
|b with applications to electric, magnetic, and atomic forces /
|c Dror Sarid.
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| 250 |
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|a Rev. ed.
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| 260 |
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|a New York :
|b Oxford University Press,
|c 1994.
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| 300 |
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|a xiii, 263 p. :
|b ill.
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| 490 |
1 |
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|a Oxford series in optical and imaging sciences ;
|v 5
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| 504 |
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|a Includes bibliographical references (p. 233-259) and index.
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| 650 |
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0 |
|a Scanning force microscopy.
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| 710 |
2 |
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|a ebrary, Inc.
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| 856 |
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|u http://site.ebrary.com/lib/ucy/Doc?id=10087124
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|a CY-NiOUC
|b 5a0455b66c5ad14ac1ecc2da
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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