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01484nam a2200397 a 4500 |
| 001 |
2051353 |
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20171112000054.0 |
| 008 |
970616s1998 nyua b 001 0 eng |
| 020 |
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|a 0070576971
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| 050 |
1 |
4 |
|a QC611.24
|b .R86 1998
|
| 082 |
0 |
4 |
|a 621.381520287
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| 082 |
0 |
0 |
|a 621.3815
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| 082 |
0 |
0 |
|2 21
|a 621.3815/2/0287
|
| 100 |
1 |
0 |
|a Runyan, W. R.
|
| 245 |
1 |
0 |
|a Semiconductor measurements and instrumentation /
|c W.R. Runyan and T.J. Shaffner.
|
| 250 |
1 |
0 |
|a 2nd ed.
|
| 260 |
1 |
0 |
|a New York :
|b McGraw-Hill,
|c c1998.
|
| 300 |
1 |
0 |
|a x, 453 σ. :
|b εικ. ;
|c 24 εκ.
|
| 504 |
1 |
0 |
|a Περιλαμβάνει βιβλιογραφικές παραπομπές και ευρετήριο
|
| 504 |
1 |
0 |
|a Περιέχει βιβλιογραφικές αναφορές και ευρετήριο
|
| 504 |
1 |
0 |
|a Includes bibliographical references and index.
|
| 504 |
1 |
0 |
|a Includes bibliographical references nad index.
|
| 650 |
1 |
0 |
|a Semiconductors.
|
| 650 |
1 |
0 |
|a Physical measurements.
|
| 650 |
1 |
7 |
|a Ημιαγωγοί
|
| 650 |
1 |
7 |
|a Φυσικές μετρήσεις
|
| 650 |
1 |
0 |
|a Semiconductors
|
| 650 |
1 |
0 |
|a Physical measurements
|
| 650 |
1 |
0 |
|a Physical measurements
|
| 650 |
1 |
0 |
|a Semiconductors
|
| 650 |
1 |
0 |
|a Semiconductors
|
| 700 |
1 |
0 |
|a Shaffner, T. J.
|
| 700 |
1 |
0 |
|a Shaffner, T. J.
|
| 700 |
1 |
0 |
|a Shaffner, T. J.
|
| 952 |
|
|
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|b 59cc26f46c5ad13446f984c6
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|d 945l
|e 621.38152 RUN
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| 952 |
|
|
|a GRThAnMak
|b 59cca0616c5ad13446022fa0
|c 998a
|d 945l
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