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|a 0471241415
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|a Gr-KaHUA
|b gre
|e AACR2
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|a eng
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|2 21
|a 530.4275
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|a In situ real-time characterization of thin films/
|c [edited by] Orlando Auciello, Alan R. Krauss
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| 260 |
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|a New York, NY
|b J. Wiley & Sons,
|c c2001
|a Chichester:
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| 300 |
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|a xi, 263 σ. :
|b εικ., πίν. ;
|c 24 εκ.
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| 500 |
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|a "A Wiley-Interscience publication."
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| 504 |
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|a Περιέχει βιβλιογραφικές παραπομπές και ευρετήριο
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| 650 |
1 |
7 |
|a Λεπτά υμένια
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| 650 |
1 |
0 |
|a Thin films
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| 700 |
1 |
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|a Auciello, Orlando,
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| 700 |
1 |
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|a Krauss, Alan Robert
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| 952 |
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|a GR-KaHUA
|b 59cca5086c5ad1344603053f
|c 998a
|d 945l
|e 530.4275 INS
|t 1
|x m
|z Books
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