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ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /

Corporate Authors: International Symposium for Testing and Failure Analysis San Jose, Calif.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Materials Park, Ohio : ASM International, 2011.
Subjects:
Electronics > Materials > Testing
Electronic apparatus and appliances > Testing
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10540844
Physical Description:xix, 456 p. : col. ill.
Bibliography:Includes bibliographical references and index.

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