Modeling and simulation for microelectronic packaging assembly manufacturing, reliability and testing /

Main Author: Liu, S. 1963-
Corporate Author: ebrary, Inc.
Other Authors: Liu, Yong,
Format: Book
Language:English
Published: Hoboken, N.J. : Wiley, 2011.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10494525
Table of Contents:
  • pt. 1. Mechanics and modeling
  • pt. 2. Modeling in microelectronic packaging and assembly
  • pt. 3. Modeling in microelectronic package reliability and test
  • pt. 4. Modern modeling and simulation methodologies : application to nano packaging.