Description: Reliability and degradation of III-V optical devices /

Main Author:	Ueda, Osamu
Format:	Book
Language:	English
Published:	Boston : Artech House , c1996 .
Subjects:	Crystals > Defects Gallium aresnide semiconductors > Reliability Light emitting diodes > Reliability Semiconductors > Failures

Physical Description:	xii, 353 p. : ill. ; 24 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0890066523