Cover Image

Reliability and degradation of III-V optical devices /

Main Author: Ueda, Osamu
Format: Book
Language:English
Published: Boston : Artech House , c1996 .
Subjects:
Crystals > Defects
Gallium aresnide semiconductors > Reliability
Light emitting diodes > Reliability
Semiconductors > Failures
ΒιβλιοθήκηΤαξιθετικός αριθμόςΑριθμός ΑντιτύπωνΠληροφορίεςΚατάσταση
ΤΕΙ Αθήνας-1ΠροβολήOPAC

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