New approaches to image processing based failure analysis of nano-scale ULSI devices /
| Main Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Amsterdam :
Elsevier/William Andrew,
2014
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| Series: | Micro and Nano Technologies Series
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| Subjects: |
| Physical Description: | 101 p. : ill. ; 23 cm |
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| Bibliography: | Includes bibliographical references |
| ISBN: | 9780323241434 |