Structural and chemical analysis of materials : X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy /
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| Format: | Book |
| Language: | English |
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Chichester ; New York:
John Wiley,
1991
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| Physical Description: | 545 p. : fig. ; 24 cm. |
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| Bibliography: | Περιέχει βιβλιογραφικές αναφορές (σ. 533-538) και ευρετήριο (σ. 539-545). |
| ISBN: | 0471950149 |