Cover Image

Semiconductor strain metrology principles and applications /

Main Author:	Wong, Terence K. S.
Corporate Author:	ebrary, Inc.
Format:	Book
Language:	English
Published:	[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]
Subjects:	Semiconductors > Design and construction > Materials. Compound semiconductors > Design and construction > Materials.
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10570978

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