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00653nam a2200193 a 4500 |
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1771572 |
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20171111234520.0 |
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020917s2003 maua s 000 0 eng |
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|z 1402072937
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|a CaPaEBR
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| 050 |
1 |
4 |
|a TK7874.65
|b .K35 2003eb
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| 100 |
1 |
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|a Kapur, Rohit.
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| 245 |
1 |
0 |
|a CTL for test information of digital ICs
|c by Rohit Kapur.
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| 260 |
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|a Boston :
|b Kluwer Academic Publishers,
|c 2003.
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| 300 |
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|a ix, 173 p. :
|b ill.
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| 650 |
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0 |
|a Digital integrated circuits
|x Testing
|x Standards.
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| 710 |
2 |
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|a ebrary, Inc.
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| 856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10067206
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| 952 |
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|a CY-NiOUC
|b 5a04556d6c5ad14ac1ecba22
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
|
