CTL for test information of digital ICs
| Main Author: | |
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| Corporate Author: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic Publishers,
2003.
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| Subjects: | |
| Online Access: | http://site.ebrary.com/lib/ucy/Doc?id=10067206 |
| Physical Description: | ix, 173 p. : ill. |
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