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00820nam a2200205 a 4500 |
| 001 |
1535620 |
| 005 |
20171111233625.0 |
| 008 |
060324s2000 cy da r 000 u eng d |
| 020 |
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|a 0792386698
|q hbk.
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| 040 |
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|a CY
|b University of Cyprus
|e AACR2
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| 050 |
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|a TK7874.D47497 2000
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| 245 |
1 |
0 |
|a Design for at-speed test, diagnosis, and measurement/
|c edited by Benoit Nadeau-Dostie
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| 260 |
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|a Boston ;
|b Kluwer Academic Publidhers,
|c c2000
|a Dordrecht:
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| 300 |
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|a xvii, 239 p. :
|b ill. ;
|c 26 cm.
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| 490 |
0 |
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|a Frontiers in electronic testing
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| 504 |
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|a Includes bibliographical references and index.
|
| 650 |
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0 |
|a Integrated circuits
|x Testing
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| 650 |
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0 |
|a Electronic apparatus and appliances
|x Testing
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| 700 |
1 |
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|a Nadeau-Dostie, Benoit
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| 952 |
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|a CY-NiOUC
|b 5a042eec6c5ad14ac1e893f4
|c 998a
|d 945l
|e TK7874.D47497 2000
|t 1
|x m
|z Books
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