Description: High-level test synthesis of digital VLSI circuits/

Main Author:	Lee, Mike Tien-Chien
Format:	Book
Language:	English
Published:	Boston: Artech House, c1997
Series:	The Artech House solid-state technology library
Subjects:	Integrated circuits > Very large scale integration > Computer-aided design Integrated circuits > Very large scale integration > Testing > Data processing Digital integrated circuits > Testing Data processing

Physical Description:	xi, 220 p. : ill. ; 24 cm.
Bibliography:	Includes bibliography (p. 199-214) and index.
ISBN:	0890069077