Applied logistic regression /

Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley.
Format: Book
Language:English
Published: New York : Wiley, c2000.
Edition:2nd ed.
Series:Wiley series in probability and statistics
Subjects:
Online Access:http://www.loc.gov/catdir/bios/wiley042/00036843.html
http://www.loc.gov/catdir/toc/onix05/00036843.html
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245 1 0 |a Applied logistic regression /  |c David W. Hosmer, Stanley Lemeshow. 
250 |a 2nd ed. 
260 |a New York :  |b Wiley,  |c c2000. 
300 |a xii, 373 p. :  |b ill. ;  |c 25 cm. 
490 0 |a Wiley series in probability and statistics 
504 |a Includes bibliographical references (p. 352-365) and index. 
650 0 |a Regression analysis. 
700 1 |a Lemeshow, Stanley. 
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