Advances in X-ray diffractometry and X-ray spectrography : a volume of fifteen selected reprints from Philips Laboratories, Irvington-on-Hudson, New York, U.S.A. /
| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
Eindhoven:
Centrex Pubishing Company,
1962
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| Item Description: | "P.L. contribution no. 188." |
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| Physical Description: | 233 p. : diagrs, tabs. ; 23 cm. |