Holdings: VLSI testing :digital and mixed analogue/digital techniques /

Main Author:	Hurst, S. L.
Corporate Author:	Institution of Electrical Engineers
Format:	Book
Language:	English
Published:	London : Institution of Electrical Engineers , c1998 .
Subjects:	Integrated circuits > Very large scale integration

Βιβλιοθήκη	Ταξιθετικός αριθμός	Αριθμός Αντιτύπων	Πληροφορίες	Κατάσταση
ΤΕΙ Αθήνας	-	1	Προβολή	OPAC