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01433nam a2200301 a 4500 |
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20171111231212.0 |
| 008 |
011121s1997 gr r 000 0 eng d |
| 020 |
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|a 0890069077
|q σκληρόδετο
|
| 040 |
|
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|a GR-KoDPT
|b gre
|e AACR2
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| 050 |
1 |
4 |
|a TK7874.75
|b .L44 1997
|a TK7874.75
|
| 082 |
|
0 |
|2 21
|a 621.39/5
|b .L44 1997
|
| 082 |
0 |
|
|2 21
|a 621.39/5
|
| 100 |
1 |
|
|a Lee, Mike Tien-Chien
|
| 245 |
0 |
0 |
|a High-level test synthesis of digital VLSI circuits/
|c Mike Tien-Chien Lee
|
| 260 |
|
|
|a Boston:
|b Artech House,
|c c1997
|
| 300 |
|
|
|a xi, 220 σ. :
|b εικ. ;
|c 24 εκ.
|
| 490 |
0 |
|
|a Artech House solid-state technology library
|
| 504 |
|
|
|a Περιέχει βιβλιογραφικές παραπομπές (σ. 199-214) και ευρετήριο
|
| 504 |
|
|
|a Includes bibliographical references (p. 199-214) and index.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Computer-aided design
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing
|x Data processing
|
| 650 |
|
0 |
|a Digital integrated circuits
|x Testing
|x Data processing
|
| 650 |
|
0 |
|a Digital integrated circuits
|x Testing
|x Data processing
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Computer-aided design
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing
|
| 710 |
|
|
|a Artech House
|x Data processing
|
| 952 |
|
|
|a GR-KoDPT
|b 59cc341b6c5ad13446fb14ad
|c 998a
|d 945l
|e TK 7874 .75
|t 1
|x m
|z Books
|
