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00781nam a2200217 a 4500 |
| 001 |
733223 |
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20171111231108.0 |
| 008 |
011116s1980 gr r 000 0 eng d |
| 040 |
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|a GR-KoDPT
|b gre
|e AACR2
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| 041 |
1 |
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|a eng
|h rus
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| 050 |
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|a TK7871.85
|b .G67413
|
| 100 |
1 |
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|a Grin, G.
|q (Grigorii)
|
| 245 |
1 |
0 |
|a Semiconductor devices, measurements and tests/
|c G. Grin ; translated from the Russian by Alexander Repyev
|
| 260 |
|
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|a Moscow:
|b Mir,
|c 1980
|
| 300 |
|
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|a 207, [1] σ. :
|b εικ. ;
|c 21 εκ.
|
| 500 |
|
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|a "Revised from the 1978 Russian third edition"--Verso σ.τ.
|
| 504 |
|
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|a Βιβλιογραφία: σ. [208]
|
| 650 |
|
0 |
|a Semiconductors
|
| 650 |
|
0 |
|a Semiconductors
|x Testing
|
| 710 |
|
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|a Mir
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| 952 |
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|a GR-KoDPT
|b 59cc24616c5ad13446f924cd
|c 998a
|d 945l
|e TK 7871 .85
|t 1
|x m
|z Books
|
