Statistical methods for reliability data /

Main Author: Meeker, William Q.
Other Authors: Escobar, Luis A.
Format: Book
Published: New York: John Wiley & Sons, c1998
Series:Wiley series in probability and statistics. Applied probability and statistics section
Subjects:
Item Description:Includes bibliographical references and index
Physical Description:xxii, 680 p. : ill. ; 23 cm.
Bibliography:Includes bibliography and index.
ISBN:0471143286