Table of Contents:
  • Preface; List of Contributors; CONTENTS; Part A Reliability; Warranty Analysis: Estimation of the Degree of Imperfect Repair via a Bayesian Approach S. Chukova, Y. Hayakawa and R. Arnold; Design of Optimum Simple Step-Stress Accelerated Life Testing Plans E.A . Elsayed and H. Zhang; A BDD-Based Algorithm for Computing the K-Terminal Network Reliability G. Hardy, C. Lucet and N. Limnios; Reliability Evaluation of a Packet-Level FEC based on a Convolutional Code Considering Generator Matrix Density T. Hino, M. Arai, S. Fukumoto and K. Iwasaki.