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1782461 |
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20171111234530.0 |
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020214s2001 ohua sb 101 0 eng d |
| 020 |
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|z 9780871707468
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| 040 |
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|a CaPaEBR
|z 0871707462
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| 050 |
1 |
4 |
|a TK7871
|b .I69 2001eb
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| 111 |
2 |
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|a International Symposium for Testing and Failure Analysis
|c Santa Clara, Calif.)
|d 2001 :
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| 240 |
1 |
0 |
|a Proceedings of the 27th International Symposium or Testing and Failure Analysis
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| 245 |
1 |
0 |
|a ISTFA 2001
|b proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
|c sponsored by EDFAS.
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| 246 |
3 |
0 |
|a Proceedings of the 27th International Symposium or Testing and Failure Analysis
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| 260 |
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|a Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis
|b ASM International,
|c c2001.
|a Materials Park, OH :
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| 300 |
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|a xix, 485 p. :
|b ill.
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| 500 |
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|a Sponsored by EDFAS, ISTFA.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
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0 |
|a Electronics
|x Materials
|x Testing
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| 650 |
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0 |
|a Electronic apparatus and appliances
|x Testing
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| 710 |
2 |
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|a ASM International.
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| 710 |
2 |
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|a Electronic Device Failure Analysis Society.
|
| 856 |
4 |
0 |
|a ebrary, Inc.
|u http://site.ebrary.com/lib/ucy/Doc?id=10320377
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| 952 |
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|a CY-NiOUC
|b 5a0456f56c5ad14ac1ece84a
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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