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01034nam a2200241 a 4500 |
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20171111234525.0 |
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021220s2002 ohua sbf 001 0 eng d |
| 020 |
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|z 0871707691
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| 040 |
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|a CaPaEBR
|z 9780871707697
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| 050 |
1 |
4 |
|a TK7871
|b .M52 2002eb
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| 245 |
0 |
0 |
|a Microelectronic failure analysis
|b desk reference.
|c prepared under the direction of the Electronic Device Failure Analysis Society publications committee.
|
| 260 |
|
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|a Materials Park, OH :
|b ASM International,
|c c2002.
|
| 300 |
|
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|a vi, 210 p. :
|b ill.
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|
| 650 |
|
0 |
|a Electronics
|x Materials
|x Testing
|
| 650 |
|
0 |
|a Microelectronics
|x Materials
|x Defects
|
| 650 |
|
0 |
|a Microelectronics
|x Materials
|x Testing
|
| 650 |
|
0 |
|a Semiconductors
|x Defects
|
| 710 |
2 |
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|a Electronic Device Failure Analysis Society.
|
| 856 |
4 |
0 |
|a ebrary, Inc.
|u http://site.ebrary.com/lib/ucy/Doc?id=10330016
|
| 952 |
|
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|a CY-NiOUC
|b 5a04563f6c5ad14ac1ecd309
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
|
