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|z 9780871707888
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|a CaPaEBR
|z 0871707888
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| 050 |
1 |
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|a TK7871
|b .I68 2003eb
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| 111 |
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|a International Symposium for Testing and Failure Analysis
|c Santa Clara, Calif.)
|d 2003 :
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| 240 |
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|a Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003
|
| 245 |
1 |
0 |
|a ISTFA 2003
|b proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
|c sponsored by EDFAS.
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| 246 |
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|a Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003
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| 260 |
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|a Conference proceedings from the 29th International Symposium for Testing and Failure Analysis
|b ASM International,
|c 2003.
|a Materials Park, Ohio :
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| 300 |
|
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|a 518 p. :
|b ill.
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| 504 |
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|a Includes bibliographical references and index.
|
| 650 |
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0 |
|a Electronics
|x Materials
|x Testing
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| 650 |
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0 |
|a Electronic apparatus and appliances
|x Testing
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| 710 |
2 |
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|a ASM International.
|
| 710 |
2 |
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|a Electronic Device Failure Analysis Society.
|
| 856 |
4 |
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|a ebrary, Inc.
|u http://site.ebrary.com/lib/ucy/Doc?id=10328966
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| 952 |
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|a CY-NiOUC
|b 5a04562e6c5ad14ac1ecd0fa
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
|
