Critical advances in reminiscence work from theory to application /

Corporate Author: ebrary, Inc.
Other Authors: Haight, Barbara K.
Format: Book
Language:English
Published: New York : Springer, c2002.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10265461
Physical Description:xix, 370 p. : ill.
Bibliography:Includes bibliographical references (p. 321-353) and index.