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01031nam a2200241 a 4500 |
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20171111234435.0 |
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040226s20042000cy da r 000 u eng d |
| 020 |
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|a 0792379918
|q hbk.
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| 040 |
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|a CY
|b University of Cyprus
|e AACR2
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| 050 |
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|a TK7874.75.B87 2004
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| 100 |
1 |
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|a Bushnell, Michael L.,
|d 1950-
|
| 245 |
1 |
0 |
|a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits/
|c Michael L. Bushnell, Vishwani D. Agrawal
|
| 260 |
|
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|a Boston:
|b Kluwer Academic,
|c 2004, c2000
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| 300 |
|
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|a xviii, 690 p. :
|b ill. ;
|c 26 cm.
|
| 490 |
0 |
|
|a Frontiers in electronic testing
|v 17
|
| 504 |
|
|
|a Includes bibliographical references (p. [631]-670) and index.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing
|
| 650 |
|
0 |
|a Digital integrated circuits
|x Testing
|
| 650 |
|
0 |
|a Mixed signal circuits
|x Testing
|
| 650 |
|
0 |
|a Semiconductor storage devices
|x Testing
|
| 700 |
1 |
|
|a Agrawal, Vishwani D.,
|
| 952 |
|
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|a CY-NiOUC
|b 5a044dc86c5ad14ac1ebe13c
|c 998a
|d 945l
|e TK7874.75.B87 2004
|t 1
|x m
|z Books
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