Ion beam surface layer analysis: proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation/
| Corporate Authors: | , , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Lausanne:
Elsevier Sequoia S.A.,
1974
|
| Subjects: |
| Item Description: | "These proceedings were originally published in Thin solid films." |
|---|---|
| Physical Description: | viii, 463 p. : ill. ; 25 cm. |
| Bibliography: | Includes bibliographical references. |
| ISBN: | 044419536X |